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- https://en.wikipedia.org/wiki/Secondary_ion_mass_spectrometrySecondary ion mass spectrometry - WikipediaSecondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the ...
- Methodshttps://serc.carleton.edu/msu_nanotech/methods/SIMS.htmlSecondary Ion Mass Spectrometer (SIMS)Jun 15, 2018 ... This technique is used for "bulk" analysis of elements and isotopes, and is particularly well-suited for analysis of isotopes and trace elements in minerals.
- https://www.cameca.com/products/sims/techniqueIntroduction to Secondary Ion Mass Spectrometry (SIMS) techniqueThe SIMS technique provides a unique combination of extremely high sensitivity for all elements from Hydrogen to Uranium and above (detection limit down to ppb ...
- EAG Laboratorieshttps://www.eag.com/techniques/mass-spec/secondary-ion-mass-spectrometry-sims/Secondary Ion Mass Spectrometry (SIMS) | EAG LaboratoriesSecondary Ion Mass Spectrometry (SIMS) ... Secondary Ion Mass Spectrometry (SIMS) detects very low concentrations of dopants and impurities. The technique ...
- https://tmi.utexas.edu/facilities/instrumentation/time-of-flight-secondary-ion-mass-spectrometer-tofsims-5Time of Flight Secondary Ion Mass Spectrometer (TOF.SIMS 5)Fees and Policies · UT Users: $60/hour · Higher Education/State Agencies: $299/hour · Corporate/External Users: $299/hour. To become a new ...
- https://uclasims.epss.ucla.edu/UCLA Secondary Ion Mass Spectrometer LaboratoryOur principal role within the national geoscience infrastructure has been in providing leadership in SIMS accessory mineral dating. As scientific ...
- Wisconsin Secondary Ion Mass Spectrometer Laboratoryhttps://wiscsims.geoscience.wisc.edu/Wisconsin Secondary Ion Mass Spectrometer Laboratory ...A primary goal of WiscSIMS is to provide experienced and inexperienced SIMS users with the best possible analytical precision and accuracy for in situ ...
- Novahttps://novami.com/nova-technology/secondary-ion-mass-spectrometry-sims/Secondary Ion Mass Spectrometry (SIMS) - NovaSecondary Ion Mass Spectrometry (SIMS). Nova Metrion® leverages secondary ion mass spectrometry (SIMS) technology to provide information that no other inline ...
- Department of Earth, Environmental, and Planetary Scienceshttps://eeps.wustl.edu/simsSecondary Ion Mass Spectrometer (SIMS)SIMS is one of the most sensitive techniques for studying surfaces of materials. It can determine the surface chemical composition, very precisely.
- https://www.phi.com/surface-analysis-equipment/nanotof.htmlPHI nanoTOF II TOF-SIMS Surface Analysis InstrumentPHI's patented Parallel Imaging MS/MS mass spectrometer provides superior sensitivity, low spectral background, unique ability to image highly topographic ...
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